Rayence Develops World's First 'X-ray Sensor' Technology at Yonsei University... to Conduct Joint Research
The fact of industry-academic cooperation with Rayence is highlighted as a research team led by Chae Young-chul, a professor of electrical and electronic engineering at Yonsei University, announced that it has developed the world's first wafer-scale high-speed, low-dose, high-resolution SPAD (Single Photon Avalanche Diode) X-ray sensor.
The research team succeeded in implementing the SPAD X-ray sensor on a wafer scale by combining silicon process-based SPAD technology and digital pixel circuit technology that enable single photon detection.
This technology was adopted as a presentation paper for the IEEE VLSI Symposium, which is considered the best academic conference in the field of system semiconductor design.
According to the thesis, the sensor uses high-speed global shutter technology to provide clear X-ray images even when taking videos. In addition, the digital pixel circuit technology without circuit noise has achieved dynamic range performance of 116 dB, which is 40 dB wider than the existing CMOS X-ray sensor. The same image quality can be obtained with a dose of 14%.
The research team said, "This study is a high technology that solves the speed, noise, and resolution problems of existing X-ray sensors," adding, "We succeeded in overcoming the limitations of the SPAD X-ray sensor, which was only 80,000 pixels, and implementing 5.5 million pixels on the wafer scale."
Rayence held a joint research agreement ceremony with Yonsei University's industry-academic cooperation group in 2018 to develop next-generation sensor technology.
Through this, various research teams, including Professor Chae, Professor Jong-hyun, Ahn of the Department of Electrical and Electronic Engineering, and Professor Jin-sung,Kim of Radiation Oncology at the Medical University, participated in the Rayence Next Generation Sensor Research Center (CAR), which is jointly operated.
